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Ultrafast and bias-free all-optical wavelength conversion using III-V-on-silicon technology

  作者 Kumar, R; Spuesens, T; Mechet, P; Kumar, P; Raz, O; Olivier, N; Fedeli, JM; Roelkens, G; Baets, R; Van Thourhout, D; Morthier, G  
  选自 期刊  OPTICS LETTERS;  卷期  2011年36-13;  页码  2450-2452  
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[摘要]Using a 7.5 mu m diameter disk fabricated with III-V-on-silicon fabrication technology, we demonstrate bias-free all-optical wavelength conversion for non-return-to-zero on-off keyed pseudorandom bit sequence (PRBS) data at the speed of 10 Gbits/s with an extinction ratio of more than 12 dB. The working principle of such a wavelength converter is based on free-carrier-induced refractive index modulation in a pump-probe configuration. We believe it to be the first bias-free on-chip demonstration of all-optical wavelength conversion using PRBS data. All-optical gating measurements in the pump-probe configuration with the same device have revealed that it is possible to achieve wavelength conversion beyond 20 Gbits/s. (C) 2011 Optical Society of America

 
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