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Low temperature wafer-level bonding for hermetic packaging of 3D microsystems - art. no. 075006

  作者 Tan, CS; Fan, J; Lim, DF; Chong, GY; Li, KH  
  选自 期刊  Journal of Micromechanics and Microengineering;  卷期  2011年21-7;  页码  75006-75006  
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[摘要]Metallic copper-copper (Cu-Cu) thermo-compression bonding, oxide-oxide (SiO2-SiO2) fusion bonding and silicon-silicon (Si-Si) direct bonding are investigated for potential application as hermetic seal in 3D microsystem packaging. Cavities are etched to a

 
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