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Improvement in the performance of ZnO thin film transistors by using ultralow-pressure sputtering - art. no. 031201

  作者 Huh, MS; Won, SJ; Yang, BS; Oh, S; Oh, MS; Jeong, JK; Kim, HJ  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2011年29-3;  页码  31201-31201  
  关联知识点  
 

[摘要]Thin film transistors (TFTs) were fabricated with a zinc oxide (ZnO) channel deposited by ultralow-pressure sputtering (ULPS) at a pressure less than 1.3 x 10(-3) Pa. The field-effect mobility (mu(FE)) and the subthreshold gate swing (SS) of the ULPS-ZnO

 
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