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Reliability studies on Ta2O5 high-kappa dielectric metal-insulator-metal capacitors prepared by wet anodization - art. no. 01AB10

  作者 Sedghi, N; Davey, W; Mitrovic, IZ; Hall, S  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2011年29-1;  页码  AB110-AB110  
  关联知识点  
 

[摘要]The temperature dependence of leakage current for tantalum oxide metal-insulator-metal capacitors has been investigated over the temperature range 20-160 degrees C. The leakage current shows an increase with temperature and the conduction mechanism at med

 
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