[摘要]：In this Letter we demonstrate a method for real-time determination of the carrier-envelope phase of each and every single ultrashort laser pulse at kilohertz repetition rates. The technique expands upon the recent work of Wittmann and incorporates a stereographic above-threshold laser-induced ionization measurement and electronics optimized to produce a signal corresponding to the carrier-envelope phase within microseconds of the laser interaction, there-by facilitating data-tagging and feedback applications. We achieve a precision of 113 mrad (6.5 degrees) over the entire 2 pi range. (C) 2010 Optical Society of America
