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Probing the electron density in undoped, Si-doped, and Mg-doped InN nanowires by means of Raman scattering

  作者 Cusco, R; Domenech-Amador, N; Artus, L; Gotschke, T; Jeganathan, K; Stoica, T; Calarco, R  
  选自 期刊  Applied Physics Letters;  卷期  2010年97-22;  页码  221906-221906  
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[摘要]We report a Raman scattering determination of the electron density in InN nanowires from the analysis of longitudinal optical-phonon-plasmon coupled modes. A Raman peak assigned to the L- coupled mode is observed in both undoped and doped InN nanowires. T

 
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