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Measurement of the thermal conductance of the graphene/SiO2 interface

  作者 Mak, KF; Lui, CH; Heinz, TF  
  选自 期刊  Applied Physics Letters;  卷期  2010年97-22;  页码  221904-221904  
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[摘要]We have examined the interfacial thermal conductance G(K) of single and multilayer graphene samples prepared on fused SiO2 substrates by mechanical exfoliation of graphite. By using an ultrafast optical pump pulse and monitoring the transient reflectivity

 
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