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Indirect excitation of Er3+ ions in silicon nitride films prepared by reactive evaporation

  作者 Steveler, E; Rinnert, H; Devaux, X; Dossot, M; Vergnat, M  
  选自 期刊  Applied Physics Letters;  卷期  2010年97-22;  页码  221902-221902  
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[摘要]Er-doped silicon nitride films were obtained by reactive evaporation of silicon under a flow of nitrogen ions and were annealed at temperatures up to 1300 degrees C. Samples were studied by infrared absorption and Raman spectrometries and by transmission

 
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