[摘要]：Single-layer graphene (SLG) is deposited onto Si/SiO2 substrates from aqueous dispersions using a scalable and quick detergent-based method (see figure). The deposits are analyzed using absorption and Raman spectroscopy and atomic force and optical microscopy. Evaluation of the two-phonon defect-induced Raman peak of individual particles on the substrate is used to confirm exfoliation into graphene monolayers.
