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Microwave Power Limiting Devices Based on the Semiconductor-Metal Transition in Vanadium-Dioxide Thin Films

  作者 Givernaud, J; Crunteanu, A; Orlianges, JC; Pothier, A; Champeaux, C; Catherinot, A; Blondy, P  
  选自 期刊  IEEE Transactions on Microwave Theory and Techniques;  卷期  2010年58-9;  页码  2352-2361  
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[摘要]We present a novel concept of microwave (MW) power-limiting devices based on reversible semiconductor-to-metal transition (SMT) of vanadium-dioxide thin films integrated on coplanar waveguides. We designed, simulated, and fabricated devices, which can be reversibly driven from a low-loss (< 0.7 dB) transmission state into an attenuating state (> 20 dB) as the VO2 material is changing from semiconductor to the metal state when the incident MW power exceeds a threshold value. These devices are broadband and present a tunable threshold power value. They could be easily integrated as protection circuits from excess power in a large variety of MW components.

 
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