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CMOS-MEMS piezoresistive force sensor with scanning signal process circuit for vertical probe card

  作者 Lee, KY; Huang, JT; Hsu, HJ; Chiu, MC; Tsai, TC; Chen, CK  
  选自 期刊  Sensors And Actuators A-Physical;  卷期  2010年160-1-2;  页码  22-28  
  关联知识点  
 

[摘要]In response to the essential role probe cards play in the semiconductor testing industry, a CMOS-MEMS force sensing devices capable of simultaneously monitoring the probe reacting force and electrical test signals is designed for probe cards. The probe re

 
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