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Development of a new generation of active AFM tools for applications in liquids

  作者 Rollier, AS; Jenkins, D; Dogheche, E; Legrand, B; Faucher, M; Buchaillot, L  
  选自 期刊  Journal of Micromechanics and Microengineering;  卷期  2010年20-8;  页码  85010-85010  
  关联知识点  
 

[摘要]Atomic force microscopy (AFM) is a powerful imaging tool with high-resolution imaging capability. AFM probes consist of a very sharp tip at the end of a silicon cantilever that can respond to surface artefacts to produce an image of the topography or surf

 
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