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Thread Relocation: A Runtime Architecture for Tolerating Hard Errors in Chip Multiprocessors

  作者 Khan, O; Kundu, S  
  选自 期刊  IEEE Transactions on Computers;  卷期  2010年59-5;  页码  651-665  
  关联知识点  
 

[摘要]As the semiconductor industry continues its relentless push for nano-CMOS technologies, device reliability and occurrence of hard errors have emerged as a dominant concern in multicores. Although regular memory structures are protected against hard errors

 
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