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A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects

  作者 Bosio, A; Girard, P; Pravossoudovitch, S; Virazel, A  
  选自 期刊  IEEE Transactions on Computers;  卷期  2010年59-3;  页码  289-300  
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[摘要]This paper presents a comprehensive framework for logic diagnosis consisting of two main phases. In the first phase, a set of suspected faulty sites is obtained by applying an approach based on an Effect-Cause analysis. Then, in the second phase, a set of

 
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