Probing the surface of organic and bioconjugated nanocrystals by using mass spectrometric imaging.

[摘要]：Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides the mass fingerprint images of semiconductor nanocrystals in sizes of 6-12 nm self-assembled on a matrix-free substrate. Org. ligands and DNA conjugated on nanocrystals yield micropatterns that overlap with those of nanocrystal materials. In contrast, other residual species display nanocrystal-free patterns.

[全文传递流程]：

一般上传文献全文的时限在1个工作日内