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A Simplified Method to Produce a Functional Test Stamp for Nanoimprint Lithography (NIL)

  作者 Yaghmaie, F; Nielsen, W; Han, H; Bhushan, A; Davis, CE  
  选自 期刊  IEEE Sensors Journal;  卷期  2009年9-3;  页码  233-234  
  关联知识点  
 

[摘要]Nanoimprint lithography (NIL) is a novel technique that allows fabrication of submicron features into substrates using a modified embossing method into a polymer resist. In most cases, a stamp is produced by direct e-beam writing into a resist and then th

 
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