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Analyzing UV/Vis/NIR Spectra-Addition of Oxygen and Nitrogen to ZnO:Al Thin Films

  作者 Stadler, A; Stollinger, J; Dittrich, H  
  选自 期刊  IEEE Sensors Journal;  卷期  2011年11-4;  页码  905-912  
  关联知识点  
 

[摘要]Exact optical analysis of transparent-conductive- oxide (TCO) thin films are necessary to optimize adequate materials for optical sensor and solar cell applications.A non-numerical theoretical concept has been used to extract approximation-free optical, s

 
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