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Scanning probe block copolymer lithography

  作者 Chai, JA; Huo, FW; Zheng, ZJ; Giam, LR; Shim, W; Mirkin, CA  
  选自 期刊  Proceedings of the National Academy of Sciences of the United States of America;  卷期  2010年107-47;  页码  20202-20206  
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[摘要]Integration of individual nanoparticles into desired spatial arrangements over large areas is a prerequisite for exploiting their unique electrical, optical, and chemical properties. However, positioning single sub-10-nm nanoparticles in a specific location individually on a substrate remains challenging. Herein we have developed a unique approach, termed scanning probe block copolymer lithography, which enables one to control the growth and position of individual nanoparticles in situ. This technique relies on either dip-pen nanolithography (DPN) or polymer pen lithography (PPL) to transfer phase-separating block copolymer inks in the form of 100 or more nanometer features on an underlying substrate. Reduction of the metal ions via plasma results in the high-yield formation of single crystal nanoparticles per block copolymer feature. Because the size of each feature controls the number of metal atoms within it, the DPN or PPL step can be used to control precisely the size of each nanocrystal down to 4.8 +/- 0.2 nm.

 
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