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[摘要]：We propose a method for detecting the local nuclear spin in semiconductor microstructures using a nuclear magnetic resonance technique that detects the longitudinal magnetization (M-z) of nuclear spins. This technique involves manipulating the nuclear spin by applying a particular sequence of pulsed gradient and homogeneous magnetic fields. By calculating the time evolution of the density operators, we demonstrate that the local change in magnetization can be extracted from the change in the magnetization of the whole system. This technique is suitable for investigating microscopic semiconductor systems with a multinuclear spin of I > 1/2. (c) 2010 American Institute of Physics. [doi:10.1063/1.3490673] |
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