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Hole-based memory operation in an InAs/GaAs quantum dot heterostructure

  作者 Marent, A; Nowozin, T; Gelze, J; Luckert, F; Bimberg, D  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-24;  页码  242114-242114  
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[摘要]We present an InAs/GaAs quantum dot (QD) memory structure with all-electrical data access which uses holes as charge carriers. Charging and discharging of the QDs are clearly controlled by a gate voltage. The stored information is read-out by a two-dimens

 
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