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Coarse-grain simulation of viscous flow and stamp deformation in nanoimprint

  作者 Sirotkin, V; Svintsov, A; Zaitsev, S; Schift, H  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2007年25-6;  页码  2379-2383  
  关联知识点  
 

[摘要]A refined coarse-grain software for the simulation of thermal nanoimprint lithography is described. This software takes into account the stamp bending during squeeze flow and is able to provide results well suited for the quantitative prediction of the residual resist thickness with an accuracy better than 10%. (c) 2007 American Vacuum Society.

 
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