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Strong suppression of internal electric field in GaN/AlGaN multi-layer quantum dots in nanowires - art. no. 141914

  作者 Songmuang, R; Kalita, D; Sinha, P; den Hertog, M; Andre, R; Ben, T; Gonzalez, D; Mariette, H; Monroy, E  
  选自 期刊  Applied Physics Letters;  卷期  2011年99-14;  页码  41914-41914  
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[摘要]Photoluminescence (PL) studies of GaN/AlxGa1-xN quantum dots (QDs) in nanowires demonstrate an efficient carrier confinement, resulting in thermally stable decay times up to 300 K. The evolution of the PL transition energy as a function of both the QD height and the Al mole fraction in the barriers, as well as the evolution of the decay time as a function of the QD height, point out that a built-in electric field is significantly smaller than the value expected from the spontaneous polarization discontinuity. This is explained by the uniaxial compressive strain resulting from the spontaneously formed Al-rich shell that envelops the QD stack. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3646389]

 
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