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Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges

  作者 Waser, R; Dittmann, R; Staikov, G; Szot, K  
  选自 期刊  ADVANCED MATERIALS;  卷期  2009年21-25-26;  页码  2632-2632  
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[摘要]This review article introduces resistive switching processes that are being considered for nanoelectronic nonvolatile memories. The three main classes are based on an electrochemical metallization mechanism, a valence change mechanism, and a thermochemical mechanism, respectively. The current understanding of the microscopic mechanisms is discussed and the scaling potential is outlined.

 
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