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Local Doping of Silicon Using Nanoimprint Lithography and Molecular Monolayers

  作者 Voorthuijzen, WP; Yilmaz, MD; Naber, WJM; Huskens, J; van der Wiel, WG  
  选自 期刊  ADVANCED MATERIALS;  卷期  2011年23-11;  页码  1346-1350  
  关联知识点  
 

[摘要]Micrometer-scale monolayer patterns of a phosphorus-containing molecular precursor are fabricated on nearly intrinsic Si(100) using nanoimprint lithography. The patterned sample is protected by a SiO(2) capping layer applied by electron beam evaporation and subjected to rapid thermal annealing (RTA) to diffuse the phosphorus dopant atoms into the bulk silicon locally.

 
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