[摘要]：We report on the coherent reflection spectroscopy of a high-quality factor micropillar, in the strong-coupling regime with a single InGaAs annealed quantum dot. The absolute reflectivity measurement is used to study the characteristics of the device at low and high excitation powers. The strong coupling is obtained with a g=16 mu eV coupling strength in a 7.3 mu m diameter micropillar, with a cavity spectral width kappa = 20.5 mu eV (Q=65 000). The factor of merit of the strong-coupling regime, 4g/kappa=3, is the current state-of-the-art for a quantum dot-micropillar system. (C) 2010 American Institute of Physics. [doi:10.1063/1.3527930]
