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The Effect of Drain/Gate Bias on Electromechanical Coupling Effect in Accelerometer Based on MESFET

  作者 Xue, CY; Tan, ZX; Shi, WL; Liu, J; Zhang, BZ; Xiong, JJ; Zhang, WD  
  选自 期刊  IEEE Sensors Journal;  卷期  2011年11-2;  页码  384-388  
  关联知识点  
 

[摘要]The paper reports a GaAs micro accelerometer by making use of the electromechanical coupling effect based on metal-semiconductor field effect transistor (MESFET). MESFET as a sensitive unit is located at high-stress region to detect the nanometers deforma

 
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