Spectroscopic evidence for limited carrier hopping interaction in amorphous ZnO thin film

[摘要]：The electronic structure of amorphous ZnO film (a-ZnO) was examined by O K- and Zn L-3-edge x-ray absorption spectroscopy and valence band photoemission spectroscopy. Comparative studies of a-ZnO and a wurtzite ZnO (w-ZnO) revealed a decrease in Zn 4s-O 2

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