Strain relaxation analysis of LaAlO3/SrTiO3 heterostructure using reciprocal lattice mapping - art. no. 071901

[摘要]：Strain-relaxation in LaAlO3/SrTiO3 heterostructures was systematically investigated with LaAlO3 film thickness in the range 4.9-84 nm. Heterostructures were characterized using reciprocal lattice mapping (RLM), high resolution rocking curve, and x-ray ref

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