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Microelectromechanical system-based vacuum gauge for measuring pressure and outgassing rates in miniaturized vacuum microelectronic devices - art. no. 02B114

  作者 Kuljic, R; Chang, J; Jayapratha, N; Dankovic, T; Banerjee, K; Feinerman, A; Busta, H  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2011年29-2;  页码  B2114-B2114  
  关联知识点  
 

[摘要]Cr/Au meander-shaped resistors were fabricated on 0.2 mu m thick square-shaped silicon nitride diaphragms with diaphragm dimensions ranging from 0.775 to 2.275 mm. The performance of these sensors was measured in a vacuum chamber as a function of resistor

 
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