Morphology and conductivity modification of poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) films induced by conductive atomic force microscopy measurements - art. no. 241911

[摘要]：Morphology and conductivity modifications in poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) films induced by conductive atomic force microscopy probe are investigated. At an applied bias of positive or negative 10 V, raised features

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