Correlation between near infrared-visible absorption, intrinsic local and global sheet resistance of poly(3,4-ethylenedioxy-thiophene) poly(styrene sulfonate) thin films

[摘要]：The ordinary dielectric function of poly(3,4-ethylenedioxy-thiophene) poly(styrene sulfonate) (PEDOT:PSS) thin films was measured using a combination of spectroscopic ellipsometry and photothermal deflection spectroscopy. This method combination allows for a highly sensitive optical characterization of thin films. Hence, even the detection of weak sub-bandgap and intra-band absorptions is enabled. These intraband transitions of free charge carriers were modeled using a Drude-type oscillator to derive an intrinsic resistances for PEDOT: PSS. These optically derived resistances were compared with those determined by a 4-probe measurement setup for two different types of PEDOT: PSS and for varied annealing temperatures. Good agreement between optical and electrical measurements could be obtained for annealing temperatures smaller than 180 degrees C. Therefore, we conclude that the proposed combination of our two optical methods is well suited to determine electrical resistances of organic layers. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3697402]

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