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Understanding the relation between stress and surface morphology in sputtered films: Atomistic simulations and experiments

  作者 Zepeda-Ruiz, LA; Chason, E; Gilmer, GH; Wang, YM; Xu, HW; Nikroo, A; Hamza, AV  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-15;  页码  151910-151910  
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[摘要]The relation between stress evolution and surface morphology during deposition of sputtered films is examined by combining kinetic Monte Carlo simulations and stress measurements. We find that the surface morphology is susceptible to an instability, which

 
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