[摘要]：Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt-SiOx thin-film data storage layer, contained within a writable perpendicular recording media, at granular (< 10 nm) length scales. The magnetic contribution to the scattering is measured as the magnetization is reversed by an external field, providing unique spatial information on the switching process. A simple model of noninteracting nanomagnetic grains provides a good description of the data and an analysis of the grain-size dependent reversal provides strong evidence for an increase in magnetic anisotropy with grain diameter. (c) 2010 American Institute of Physics. [doi:10.1063/1.3486680]
