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In situ studies of Al2O3 and HfO2 dielectrics on graphite

  作者 Pirkle, A; Wallace, RM; Colombo, L  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-13;  页码  133106-133106  
  关联知识点  
 

[摘要]Deposition of Al2O3 and HfO2 dielectrics on graphite is studied as a route to the formation of a high-kappa dielectric on graphene. Electron beam evaporation of metal Al and Hf is followed by a separate oxidation step. Reactive e-beam deposition of HfO2 b

 
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