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Memory switching properties of e-beam evaporated SiOx on N++ Si substrate - art. no. 083502

  作者 Wang, YZ; Chen, YT; Xue, F; Zhou, F; Chang, YF; Fowler, B; Lee, JC  
  选自 期刊  Applied Physics Letters;  卷期  2012年100-8;  页码  83502-83502  
  关联知识点  
 

[摘要]The resistive switching between high impedance ("off" state) and low impedance ("on" state) is demonstrated on e-beam evaporated SiOx/Si resistive random access memory devices in this paper. The set and reset voltages are independent of the device perimet

 
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