Magnetic and electronic properties of the interface between half metallic Fe3O4 and semiconducting ZnO - art. no. 081603

[摘要]：We have investigated the magnetic depth profile of an epitaxial Fe3O4 thin film grown directly on a semiconducting ZnO substrate by soft x-ray resonant magnetic reflectometry (XRMR) and electron energy loss spectroscopy (EELS). Consistent chemical profile

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