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Direct Measurement of the Growth Mode of Graphene on SiC(0001) and SiC(000(1)over-bar)

  作者 Hannon, JB; Copel, M; Tromp, RM  
  选自 期刊  PHYSICAL REVIEW LETTERS;  卷期  2011年107-16;  页码  166101-166101  
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[摘要]We have determined the growth mode of graphene on SiC(0001) and SiC(000 (1) over bar) using ultrathin, isotopically labeled Si(13)C "marker layers" grown epitaxially on the Si(12)C surfaces. Few-layer graphene overlayers were formed via thermal decomposition at elevated temperature. For both surface terminations (Si face and C face), we find that the (13)C is located mainly in the outermost graphene layers, indicating that, during decomposition, new graphene layers form underneath existing ones.

 
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