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Mechanisms of nanorod growth on focused-ion-beam-irradiated semiconductor surfaces: Role of redeposition - art. no. 053103

  作者 Wu, JH; Goldman, RS  
  选自 期刊  Applied Physics Letters;  卷期  2012年100-5;  页码  53103-53103  
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[摘要]We have examined the formation and evolution of irradiation-induced nanorod (NR) growth through a comparison of focused-ion-beam irradiation of InSb wafers and InSb/GaAs heterostructures. Above a critical ion dose, cone-shaped NRs capped with In islands form on both InSb surfaces. For InSb wafers, the NR base diameter increases with ion energy. In the case of InSb/GaAs heterostructures, as the milled depth approaches the InSb/GaAs interface, the cone-shaped NRs transition to capless NRs with a truncated cone shape. These results suggest a growth mechanism in which both the NR cap and body are supplied by redeposition of atoms sputtered from InSb. (C) 2012 American Institute of Physics. [doi:10.1063/1.3675641]

 
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