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Atomic Imaging of Phase Transitions and Morphology Transformations in Nanocrystals

  作者 van Huis, MA; Young, NP; Pandraud, G; Creemer, JF; Vanmaekelbergh, D; Kirkland, AI; Zandbergen, HW  
  选自 期刊  ADVANCED MATERIALS;  卷期  2009年21-48;  页码  4992-4992  
  关联知识点  
 

[摘要]A newly developed SiN microhotplate allows specimens to be studied at temperatures up to 1000 K at a resolution of 100 picometer (see image). Aberration-corrected transmission electron microscopy has become a commonplace tool to investigate stable crystals; however, imaging transient nanocrystals is much more demanding. Morphological transformations in gold nanoparticles and layer-by-layer sublimation of PbSe nanocrystals is imaged with atomic resolution.

 
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