[摘要]：A high-sensitivity capacitive-coupling receiver is presented for wireless wafer probing systems. The receiver with the optimum logic threshold (OLT) achieves the highest sensitivity of 25 mV at the data rate of 2 Gb/s in 0.18-mu m CMOS. The OLT receiver increases the communication distance by more than four times while providing tolerance against distance-voltage-area variations.
