个性化文献订阅>期刊> Applied Physics Letters
 

Identification of a paramagnetic recombination center in silicon/silicon-dioxide interface

  作者 Matsuoka, T; Vlasenko, LS; Vlasenko, MP; Sekiguchi, T; Itoh, KM  
  选自 期刊  Applied Physics Letters;  卷期  2012年100-15;  页码  152107-152107  
  关联知识点  
 

[摘要]A paramagnetic recombination center having an orthorhombic symmetry with g[110] = 2.0095(2), g[001] = 2.0038(2), and g[(1) over bar 10] = 2.0029(2) is found at the interface between silicon and native oxide. The center is referred to P-m center and observed by a spin dependent recombination based electron paramagnetic resonance detection that has the sensitivity of similar to 10(11) spins/cm(2). The employment of an isotopically enriched Si-28 sample with the concentration of Si-29 nuclear spins reduced to 0.017% leads to narrowing of the resonance line. This narrowing is the key for the accurate determination of the angular dependence of the g-factor. (C) 2012 American Institute of Physics.[http://dx.doi.org/10.1063/1.3702785]

 
      被申请数(0)  
 

[全文传递流程]

一般上传文献全文的时限在1个工作日内