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Recovery prevention via pressure control in thermal nanoimprint lithography

  作者 Scheer, HC; Bogdanski, N; Mollenbeck, S; Mayer, A  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2009年27-6;  页码  2882-2887  
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[摘要]In order to investigate the nonuniformity occurring below wider patterns during thermal nanoimprint lithography, the pressure situation is analyzed in detail. A balance of vertical forces shows that the gas pressure within the cavities is negligible, wher

 
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