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Low energy Ar+ ion beam machining of Si thin layer deposited on a Zerodur (R) substrate for extreme ultraviolet lithography projection optics

  作者 Iwata, T; Fujiwara, K; Pahlovy, SA; Miyamoto, I  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2009年27-6;  页码  2894-2899  
  关联知识点  
 

[摘要]For the final correction of the surface figure error of aspherical substrates used in the optics of extreme ultraviolet lithography, ion beam figuring (IBF), which is essentially a machining technique, is regarded as the most promising technique for the j

 
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