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InGaN multiquantum well structure with a reduced internal electric field and carrier decay process by tunneling

  作者 Park, YM; Son, JK; Chung, HJ; Sone, C; Park, Y  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-23;  页码  231917-231917  
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[摘要]An InGaN/InGaN multiquantum well (MQW) structure with a reduced internal electric field is grown, and compared with a conventional InGaN/GaN MQW structure. Time-integrated and time-resolved photoluminescence (PL) are measured as a function of an external

 
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