Crystal defect topography of Stranski-Krastanow quantum dots by atomic force microscopy

[摘要]：We demonstrate a technique to monitor the defect density in capped quantum dot (QD) structures by performing an atomic force microscopy (AFM) of the final surface. Using this method we are able to correlate their density with the optical properties of the

[全文传递流程]：

一般上传文献全文的时限在1个工作日内