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Charge trapping induced by plasma in alumina electrode surface investigated by thermoluminescence and optically stimulated luminescence - art. no. 051501

  作者 Ambrico, PF; Ambrico, M; Schiavulli, L; Ligonzo, T; Augelli, V  
  选自 期刊  Applied Physics Letters;  卷期  2009年94-5;  页码  51501-51501  
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[摘要]The plasma of a dielectric barrier discharge can fill traps in the alumina that cover the electrode. Trap energies and lifetimes are estimated by thermoluminescence and optically stimulated luminescence. Comparison with similar results for traps created by other radiation sources clarifies the mechanisms regulating this effect. Alumina's trap energies are approximately 1 eV, and the traps remain active for several days after plasma exposure. These results could be important to keep dielectric barrier discharge plasmas uniform since a trapped charge can be an electron reservoir.

 
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