[摘要]：Organic heterojunctions comprising of n-type fluorinated copper-phthalocyanine (F16CuPc) and p-type cobalt-phthalocyanine (CoPc) layers were prepared on (001) LaAlO3 substrates. In the entire temperature range of 300-30 K, F16CuPc/CoPc heterojunctions showed an ohmic conduction with three order of magnitude lower resistivity than the individual layers. This indicates formation of a charge accumulation layer at the interface. Kelvin probe studies showed that charge accumulation layer is similar to 10 nm thick on both the sides of the interface. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3699272]
