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Effects of a Gd capping layer on electrical characteristics of metal-oxide-semiconductor field effect transistors with a TaC gate electrode and a HfSiON gate dielectric

  作者 Park, HB; Park, CS; Kang, CY; Song, SC; Lee, BH; Jang, TY; Kim, TW; Jeong, JK; Choi, R  
  选自 期刊  Applied Physics Letters;  卷期  2009年95-19;  页码  192113-192113  
  关联知识点  
 

[摘要]Effects of Gd capping of HfSiON gate dielectric oil the characteristics of n metal-oxide-semiconductor field effect transistor (nMOSFET) with TaC gate electrode were investigated. MOSFETs with an in situ deposited Gd/TaC bilayer demonstrated a reduced equ

 
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