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Interdependence of optimum exposure dose regimes and the kinetics of resist dissolution for electron beam nanolithography of polymethylmethacrylate

  作者 Mohammad, MA; Fito, T; Chen, J; Aktary, M; Stepanova, M; Dew, SK  
  选自 期刊  Journal Of Vacuum Science & Technology B;  卷期  2010年28-1;  页码  L1-L4  
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[摘要]The authors report a systematic experimental study of dense nanostructures in polymethylmethacrylate (PMMA) created by low-energy electron beam lithography (EBL) with varying duration and temperature of the resist dissolution. They observe that decreasing

 
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