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Design Solutions for Sample-and-Hold Circuits in CMOS Nanometer Technologies

  作者 Centurelli, F; Monsurro, P; Pennisi, S; Scotti, G; Trifiletti, A  
  选自 期刊  IEEE Transactions on Circuits and Systems II;  卷期  2009年56-6;  页码  459-463  
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[摘要]Solutions for the design of low-voltage sample-and-hold (S/H) circuits in CMOS nanometer technologies arc presented. As a design example, a 0.8-V supply S/H is designed and simulated using a 130-nm CMOS process. It dissipates 0.5 mW at dc and provides almost a rail-to-rail signal swing. When clocked at 40 MS/s and with a 1.4-V-PP differential input signal, the simulated spurious-free dynamic range, signal-to-noise ratio, and total harmonic distortion are 57, 67, and -56 dB (9 equivalent bits), respectively, with low sensitivity to supply, temperature, process, and mismatch variations. The proposed solution employs a three-stage low-voltage amplifier without a tail current source in the differential pair and a switch topology, which combines clock voltage doubling and dummy switches.

 
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